The structure and working principle of the devices for melting point measurement by means of thin film comparative method of cryoscopy were introduced.
介绍凝固
薄层比较法测量熔标准物质熔的测量装置的构成与
作原
。
The structure and working principle of the devices for melting point measurement by means of thin film comparative method of cryoscopy were introduced.
介绍凝固薄层比较法测量熔标准物质熔的测量装置的构成与作原。
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