Cathodoluminescence (CL) spectra show a strong band-edge emission around the V-shape pits.
阴极射线的萤光光谱显示了很强的能隙光强度在V形凹洞的边
。
Cathodoluminescence (CL) spectra show a strong band-edge emission around the V-shape pits.
阴极射线的萤光光谱显示了很强的能隙光强度在V形凹洞的边
。
This system has superior performance in image quality, space resolution , ?m and nm Cathodoluminescence image and spectrum analysis of semiconductor materials.
该系统在质量、
分辨、阴极荧光成
及光谱分析等方面具有优越的性能。
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