LCR

The crystal structure was studied by means of X-ray diffraction,magnetic disaccommodation measurements were carry out with a computer aided system based on a LCR bridge.

用X射线衍射对粉的结构行了观测,磁导率减落测用计算机辅助系统的阻抗自动测(LCR电桥)来完成。

For electrical properties of MOS capacitors, the C-V curves were obtained by LCR meter (HP4284A), and picoampere meter (HP4140B) was used to measure the J-V curves.

另外以电感电容电阻计(HP4284A)行C-V曲线测；以微安培计(HP4140B)行J-V曲线测。